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APROPOS) project is hiring 15 international “Early Stage Researchers” for PhD positions in Europe (Finland, Sweden, Netherlands, Austria, Switzerland, Italy, France, Spain, and UK) with 36-month fully-funded contracts.

TestGroup team is attending HiPEAC Computing Systems Week 2019 in Bilbao (Spain). Interesting technical discussions and presentations, lot of friends and colleagues, all organized in a beautiful landscape. 

On behalf of the DFT19 Program Committee, we are delighted to inform you that your paper “Combining Cluster Sampling and ACE analysis to improve fault-injection based reliability evaluation of GPU-based systems” has been ACCEPTED for ORAL presentation at the 32th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems.

Today at 5:15PM I’m going to give an invited talk at the 25th IEEE International Symposium on On-Line Testing and Robust System Design in Kazan in Rhodes (Greece).

The topic of the talk will be “Bayesian Models For Early Cross-Layer Reliability Analysis and Design Space Exploration” and will be part of Session 5S “Cost-Effective Resilience: Advanced Cross-Layer Analysis and Optimization Techniques” organized by Prof. M. Shafique (TU Wien).

After more than 1 year from its end, the FP7 Clereco project (http://www.clereco.eu) still produces results in the field of cross-layer reliability analysis.

This paper that has been accepted for publication in an upcoming issue of IEEE Transactions on Computers proposes a framework for Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems.

Today I’m going to give a keynote talk at the 16th IEEE EAST-WEST DESIGN & TEST SYMPOSIUM in Kazan (Russia).

The topic of the talk will be “Cross Layer Reliability: a Reality or a PromiseNever Coming True?”.

Dr. Alessandro Vallero from TestGroup presented our latest study on “Multi-faceted Microarchitecture Level Reliability Characterization for NVIDIA and AMD GPUs” @ 2018 IEEE VLSI Test Symposium, San Francisco, CA, USA (April 22-25, 2018).

TestGroup team is attending IOLTS 2018 in Platja D’Aro (Spain). Interesting technical discussions and presentations, lot of friends and colleagues, all organized in a beautiful landscape …

Our Ph.D. student Alberto Carelli is going to give a presentation on “Securing bitstream integrity, confidentiality and authenticity in reconfigurable mobile heterogeneous systems” today at the IEEE International Conference on Automation, Quality and Testing, Robotics 2018 – AQTR’18