Invited talk @ 25th IEEE International Symposium on On-Line Testing and Robust System Design
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- July 1, 2019
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Rhodes Island, Greece (July 1st, 2019).
Today at 5:15PM I’m going to give an invited talk at the 25th IEEE International Symposium on On-Line Testing and Robust System Design in Rhodes (Greece).
The topic of the talk will be “Bayesian Models For Early Cross-Layer Reliability Analysis and Design Space Exploration” and will be part of Session 5S “Cost-Effective Resilience: Advanced Cross-Layer Analysis and Optimization Techniques” organized by Prof. M. Shafique (TU Wien).
You can find the slides of the presentation on SlideShare.
[slideshare id=152963677&doc=presentation-testgroup-190701152738]
Technical details related to the content of this presentation are available in the following related papers:
- A. Vallero, A. Savino, A. Carelli, S. Di Carlo “Bayesian models for early cross-layer reliability analysis and design space exploration”, 25th IEEE International Symposium on On-Line Testing and Robust System Design (Rodhes Island, Greece July 1-3, 2019)
- A. Savino, A. Vallero, S. Di Carlo, “ReDO: Cross-Layer Multi-Objective Design-Exploration Framework for Efficient Soft Error Resilient Systems” IEEE TRANSACTIONS ON COMPUTERS, Vol.undefined, ISSN: 0018-9340, DOI: 10.1109/TC.2018.2818735
- A. Vallero, A. Savino, A. Chatzidimitriou, M. Kaliorakis, M. Kooli, M. Riera Villanueva, G. Di Natale, A. Bosio, R. Canal, D. Gizopoulos, S. Di Carlo SyRA: Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems IEEE TRANSACTIONS ON COMPUTERS, Vol.68, pp.765-783, ISSN: 0018-9340, DOI: 10.1109/TC.2018.288722
If you attend the conference please join the session.
Stefano Di CARLO