Yearly Archives: 2017

We are happy to announce that Testgroup in collaboration with LIRMM (Montpellier, FR) will organize a special session on “How Approximate Computing impacts Verification, Test and Reliability of Integrated Circuits” at the IEEE VLSI Test Symposium 2018 (VTS’18), Hyatt Hotel, San Francisco, CA (USA)  on April 22-25, 2018.

New paper titled “Multi-faceted Microarchitecture Level Reliability Characterization for NVIDIA and AMD GPUs” accepted for publication at the IEEE VLSI Test Symposium 2018 (VTS’18), Hyatt Hotel, San Francisco, CA (USA)  on April 22-25, 2018.

DAUIN PhD students at the end of their studies (XXXX cycle) will present and discuss their research activities.. The event is an opportunity to discover the PhD program in Computer and Control Engineering and to better understand the research activities carried on at DAUIN. It is open to everyone interested.

Alessandro Carelli, Ph.D. student at Politecnico di Torino will present today the results of a study of the effect of side-channel attacks on the SEcube(TM) platform. The presentation will be given at the 15th IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS-2017) in Novi Sad, Serbia.

Sakis Chatzidimitriou Ph.D. student at University of Athens under Prof. Dimitris Gizopoulos presented yesterday the CPUs fault injection study (on ARM Cortex-A9 CPU) between microarchitecture-level and RT-level result of a collaboration between University of Athens, Politecnico di Torino and Intel/Yogitech in CLERECO FP7 project.

I’m very proud to announce that yesterday my student Alessandro Vallero defended his Ph.D. thesis in front of a committee of five experts in his research field and was awarded the Ph.D. degree in Computer Engineering “cum laude”,

On May 30 Alessandro VALLERO will discuss his PhD thesis, titled ” Cross layer reliability estimation for digital systems”

The 22nd IEEE European Test Symposium will start in a few days in Limassol (Cyprus).

Testgroup will be there with two interesting presentations.