FARM (Fault tolerant ARM) research and demonstrate solutions for the design of System on Chip ICs that tolerate soft errors by developing circuit and software designs to recognise and correct for faults during operation.
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European Network for Initial and Continuing Education in VLSI/SoC Testing Using Remote Ate Facilities.
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Development of on-line BISTed structures for distributed systems in the framework of the concurrent engineering environment.
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Development of on-line BISTed structures for distributed systems in the framework of the concurrent engineering environment.
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Development of a functional BIST architecture able to reuse the intrinsic functionalities of a system to perform self-test activities.
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Definition of new methodologies and instruments to support the design of high-reliable systems for space applications starting from commercial-of-the-shelf (COTS) components which are not individually designad to guarantee the required reliability requirements for this class of applications.
Read MoreDevelopemnt of a reliable computing system for space applications based on COTS components and its validation through fault injection
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